PaneraTech’s visionary technology has produced cutting edge solutions in free space microwave measurement. Our material characterization products are non-contact and can characterize multiple layers of material. These products are easy to use and give real-time accurate data. All of these technologies have been developed with the funding provided by the National Institute of Standards and Technology (NIST).
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We’ve developed the industry’s first pre-calibrated, all-in-one multi-layer material characterization system. You won’t need a microwave expert to use imecsLAB. Just place the sample and press the GO button.
Significantly improve quality control without interrupting production. imecsFAB measures the entire width of film without contact and identifies electrical and physical defects in real-time. This product integrates easily into your current production environment.