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PaneraTech, Inc., Selected for Highly Prestigious NSF SBIR Phase I Award to Develop a 3-D Wireless Imaging Sensor for Structural Health Monitoring of High Temperature Furnaces.

May 20th, 2011

Falls Church, VA – PaneraTech, Inc., was recently notified by the National Science Foundation that PaneraTech’s advanced 3-D wireless imaging sensor technology for structural health monitoring of high temperature furnaces was awarded a SBIR Phase I award. The NSF SBIR program is a highly prestigious and competitive program that granted awards to only 95 companies, from among 935 applicants in the latest solicitation round. PaneraTech CEO and CTO Dr. Bayram noted,”The fact that we were chosen among so many showed that NSF had faith in our technology and our very strong team of researchers.” PaneraTech has partnered with several researchers from the leading U.S. institutions and industrial partners on this technology.

“This technology is a gamechanger in many heavy manufacturing industries,” Dr. Bayram said, “Even though the sensor is envisioned to be used by many industries involving high temperature furnaces, the glass manufacturing industry is initially targeted. ” PaneraTech has already established strong relationships and partnerships with major glass manufacturers in the world, which is critical to developing a sensor that matches their needs. “Our entire team is extremely excited for the opportunity to work with several major industry players.” Dr. Bayram said.

For further questions regarding this technology, please contact us at InnovativeTechnologies@paneratech.com.

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