imecsFAB

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Overview & Features

Monitor useful material characterization data in real time without interrupting production. IMECSFab will help you increase consistency and improve quality control. The development of IMECSFab is funded by the National Institute of Standards and Technology (NIST) to address a major technology gap in specialty film manufacturing.

  • Provides real-time feedback
  • High Speed Data Acquisition to keep up with the speed of your manufacturing line
  • Non-contact to maintain product integrity
  • Seamless Easy Integration that won't change your business model

Our device covers the entire film width and even measures multiple layers.

Technology

IMECSFab is built on PaneraTech’s patent-pending edge treatment and specialty microwave probes that enable real-time monitoring of electrical properties of specialty films. This innovative technology is non-contact and measures scattering parameters. It can be used to measure electrical properties of multi-layer film by measuring the thickness of each layer and identifying the complex dielectric properties of each layer.

  • Extracts Sheet Resistance of Resistive Films such as Touch Films or CNT based films
  • Extracts Thickness of Each Layer in Multi-layer Films
  • Determines Presence of Physical Defects such as Holes and Slits
  • Covers Entire Film Width with Innovative Edge Treatment Technique
  • Inline Defect Labeling System

IMECS Fab extracts sheet resistance of resistive films such as Touch Films or CNT based films. It also determines presence of physical defects such as holes and slits and includes an inline defect labeling system- ALL done in Non-Contact.

IMECSFab is configured to each customer's specific need. Contact PaneraTech to find out how IMECSFab can meet your needs.

Options & Accessories

Currently in development. Contact PaneraTech for more information.

Document Library

Currently in development. Contact PaneraTech for more information.