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PaneraTech’s visionary technology has produced cutting edge solutions in free space microwave measurement. Our material characterization products are non-contact and can characterize multiple layers of material. These products are easy to use and give real-time accurate data. All of these technologies have been developed with the funding provided by the National Institute of Standards and Technology (NIST).

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product-imecslabOur Benchtop Solution: imecsLAB

We’ve developed the industry’s first pre-calibrated, all-in-one multi-layer material characterization system. You won’t need a microwave expert to use imecsLAB. Just place the sample and press the GO button.

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product-imecsfabOur Online Solution: imecsFAB

Significantly improve quality control without interrupting production. imecsFAB measures the entire width of film without contact and identifies electrical and physical defects in real-time. This product integrates easily into your current production environment.

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